Prof. Jung Awarded Metrology Science Prize
Prof. Jung Awarded Metrology Science Prize
  • Reporter Reo Ye-jin
  • 승인 2011.06.08 12:49
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Professor Yoon Hee Jeong of the Department of Physics was awarded the Metrology Science Prize by the Korea Research Institute of Standard and Science (KRISS). Prof. Jeong has concentrated on thermal property research for the last 30 years and finally developed a vacuum measuring instrument and accelerator tester, contributing to the advancement of metrology techniques.


In addition, Prof. Jeong had previously won the Prime Minister’s Award for Patent Exhibition in 2004 and the Netzsch-KSTP Award given to an expert who accomplished great results once per two months last April.

KRISS has appointed and officially announced a person of merit from experts in the area of metrology science and technology. In addition to Prof. Jeong, the Korean Society for Laboratory Medicine and Lee Sun-gil, president of Young In Scientific Co., were awarded the Metrology Achievement Prize and Metrology Technology Prize, respectively.

Meanwhile, the award ceremony was held in the KRISS Technical Service Building on May 20 in conjunction with the celebration of Global Metrology Day.